Pseudo-Label Quality Decoupling and Correction for Semi-Supervised Instance Segmentation
Journal:
arXiv
Published Date:
May 16, 2025
Abstract
Semi-Supervised Instance Segmentation (SSIS) involves classifying and
grouping image pixels into distinct object instances using limited labeled
data. This learning paradigm usually faces a significant challenge of unstable
performance caused by noisy pseudo-labels of instance categories and pixel
masks. We find that the prevalent practice of filtering instance pseudo-labels
assessing both class and mask quality with a single score threshold, frequently
leads to compromises in the trade-off between the qualities of class and mask
labels. In this paper, we introduce a novel Pseudo-Label Quality Decoupling and
Correction (PL-DC) framework for SSIS to tackle the above challenges. Firstly,
at the instance level, a decoupled dual-threshold filtering mechanism is
designed to decouple class and mask quality estimations for instance-level
pseudo-labels, thereby independently controlling pixel classifying and grouping
qualities. Secondly, at the category level, we introduce a dynamic instance
category correction module to dynamically correct the pseudo-labels of instance
categories, effectively alleviating category confusion. Lastly, we introduce a
pixel-level mask uncertainty-aware mechanism at the pixel level to re-weight
the mask loss for different pixels, thereby reducing the impact of noise
introduced by pixel-level mask pseudo-labels. Extensive experiments on the COCO
and Cityscapes datasets demonstrate that the proposed PL-DC achieves
significant performance improvements, setting new state-of-the-art results for
SSIS. Notably, our PL-DC shows substantial gains even with minimal labeled
data, achieving an improvement of +11.6 mAP with just 1% COCO labeled data and
+15.5 mAP with 5% Cityscapes labeled data. The code will be public.
