A few-shot segmentation method for prohibited item inspection.
Journal:
Journal of X-ray science and technology
Published Date:
Jan 1, 2021
Abstract
BACKGROUND: With the rapid development of deep learning, several neural network models have been proposed for automatic segmentation of prohibited items. These methods usually based on a substantial amount of labelled training data. However, for some prohibited items of rarely appearing, it is difficult to obtain enough labelled samples. Furthermore, the category of prohibited items varies in different scenarios and security levels, and new items may appear from time to time.