Randomness assisted in-line holography with deep learning.

Journal: Scientific reports
Published Date:

Abstract

We propose and demonstrate a holographic imaging scheme exploiting random illuminations for recording hologram and then applying numerical reconstruction and twin image removal. We use an in-line holographic geometry to record the hologram in terms of the second-order correlation and apply the numerical approach to reconstruct the recorded hologram. This strategy helps to reconstruct high-quality quantitative images in comparison to the conventional holography where the hologram is recorded in the intensity rather than the second-order intensity correlation. The twin image issue of the in-line holographic scheme is resolved by an unsupervised deep learning based method using an auto-encoder scheme. Proposed learning technique leverages the main characteristic of autoencoders to perform blind single-shot hologram reconstruction, and this does not require a dataset of samples with available ground truth for training and can reconstruct the hologram solely from the captured sample. Experimental results are presented for two objects, and a comparison of the reconstruction quality is given between the conventional inline holography and the one obtained with the proposed technique.

Authors

  • Manisha
    Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.
  • Aditya Chandra Mandal
    Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.
  • Mohit Rathor
    Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.
  • Zeev Zalevsky
    Faculty of Engineering and the Nano-Technology Center, Bar-Ilan University, Ramat Gan, 52900 Israel.
  • Rakesh Kumar Singh
    Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India. krakeshsingh.phy@iitbhu.ac.in.