In focused ion beam (FIB) tomography, a combination of FIB with a scanning electron microscope (SEM) is used for collecting a series of planar images of the microstructure of nanoporous materials. These planar images serve as the basis for reconstruc...
Correlative microscopy combines data from different microscopical techniques to gain unique insights about specimens. A key requirement to unlocking the full potential is an advanced classification method that can combine the various analytical signa...
Techniques for training artificial neural networks (ANNs) and convolutional neural networks (CNNs) using simulated dynamical electron diffraction patterns are described. The premise is based on the following facts. First, given a suitable crystal str...