Streak artefact removal in x-ray dark-field computed tomography using a convolutional neural network.

Journal: Medical physics
Published Date:

Abstract

BACKGROUND: Computed tomography (CT) relies on the attenuation of x-rays, and is, hence, of limited use for weakly attenuating organs of the body, such as the lung. X-ray dark-field (DF) imaging is a recently developed technology that utilizes x-ray optical gratings to enable small-angle scattering as an alternative contrast mechanism. The DF signal provides structural information about the micromorphology of an object, complementary to the conventional attenuation signal. A first human-scale x-ray DF CT has been developed by our group. Despite specialized processing algorithms, reconstructed images remain affected by streaking artifacts, which often hinder image interpretation. In recent years, convolutional neural networks have gained popularity in the field of CT reconstruction, amongst others for streak artefact removal.

Authors

  • Tom Kumschier
    Chair of Biomedical Physics, Department of Physics, School of Natural Sciences, Technical University of Munich, Garching, Germany.
  • Johannes Thalhammer
    Chair of Biomedical Physics, Department of Physics, School of Natural Sciences, Technical University of Munich, Garching, Germany.
  • Clemens Schmid
    Chair of Biomedical Physics, Department of Physics, School of Natural Sciences, Technical University of Munich, Garching, Germany.
  • Jakob Haeusele
    Chair of Biomedical Physics, Department of Physics, School of Natural Sciences, Technical University of Munich, Garching, Germany.
  • Thomas Koehler
    Institute for Advanced Study, Technical University of Munich, Garching, Germany.
  • Franz Pfeiffer
    Department of Diagnostic and Interventional Radiology, School of Medicine & Klinikum rechts der Isar, Technical University of Munich, München, Germany.
  • Tobias Lasser
    Technical University of Munich, Germany.
  • Florian Schaff
    Chair of Biomedical Physics, Department of Physics, School of Natural Sciences, Technical University of Munich, Garching, Germany.