A machine learning framework to adjust for learning effects in medical device safety evaluation.
Journal:
Journal of the American Medical Informatics Association : JAMIA
PMID:
39471493
Abstract
OBJECTIVES: Traditional methods for medical device post-market surveillance often fail to accurately account for operator learning effects, leading to biased assessments of device safety. These methods struggle with non-linearity, complex learning curves, and time-varying covariates, such as physician experience. To address these limitations, we sought to develop a machine learning (ML) framework to detect and adjust for operator learning effects.