Spherical Harmonics-Based Deep Learning Achieves Generalized and Accurate Diffusion Tensor Imaging.

Journal: IEEE journal of biomedical and health informatics
PMID:

Abstract

Diffusion tensor imaging (DTI) is a prevalent magnetic resonance imaging (MRI) technique, widely used in clinical and neuroscience research. However, the reliability of DTI is affected by the low signal-to-noise ratio inherent in diffusion-weighted (DW) images. Deep learning (DL) has shown promise in improving the quality of DTI, but its limited generalization to variable acquisition schemes hinders practical applications. This study aims to develop a generalized, accurate, and efficient DL-based DTI method. By leveraging the representation of voxel-wise diffusion MRI (dMRI) signals on the sphere using spherical harmonics (SH), we propose a novel approach that utilizes SH coefficient maps as input to a network for predicting the diffusion tensor (DT) field, enabling improved generalization. Extensive experiments were conducted on simulated and in-vivo datasets, covering various DTI application scenarios. The results demonstrate that the proposed SH-DTI method achieves advanced performance in both quantitative and qualitative analyses of DTI. Moreover, it exhibits remarkable generalization capabilities across different acquisition schemes, centers, and scanners, ensuring its broad applicability in diverse settings.

Authors

  • Yunwei Chen
  • Jialong Li
    Department of Neurosurgery, Third Hospital of Baoji City, Baoji, 721000 Shaanxi, China.
  • Qiqi Lu
    School of Biomedical Engineering, Southern Medical University, Guangzhou, China.
  • Ye Wu
    Department of Radiology and BRIC, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina, USA.
  • Xiaoming Liu
    College of Agriculture, Northeast Agricultural University, Harbin, China.
  • Yuanyuan Gao
  • Yanqiu Feng
    School of Biomedical Engineering, Southern Medical University, Guangzhou, China.
  • Zhicheng Zhang
  • Xinyuan Zhang
    Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China.