Image set for deep learning: field images of maize annotated with disease symptoms.

Journal: BMC research notes
Published Date: Jul 3, 2018

Abstract

OBJECTIVES: Automated detection and quantification of plant diseases would enable more rapid gains in plant breeding and faster scouting of farmers' fields. However, it is difficult for a simple algorithm to distinguish between the target disease and other sources of dead plant tissue in a typical field, especially given the many variations in lighting and orientation. Training a machine learning algorithm to accurately detect a given disease from images taken in the field requires a massive amount of human-generated training data.

Authors

  • Tyr Wiesner-Hanks
    First author: Department of Computer Science, Columbia University in the City of New York, 10027; second, fourth, and sixth authors: Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY 14853; third author: Department of Mechanical Engineering, Columbia University; fifth author: Uber AI Labs, San Francisco 94103; seventh author: Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University; and eighth author: Department of Mechanical Engineering and Institute of Data Science, Columbia University.
  • Ethan L Stewart
    First author: Department of Computer Science, Columbia University in the City of New York, 10027; second, fourth, and sixth authors: Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY 14853; third author: Department of Mechanical Engineering, Columbia University; fifth author: Uber AI Labs, San Francisco 94103; seventh author: Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University; and eighth author: Department of Mechanical Engineering and Institute of Data Science, Columbia University.
  • Nicholas Kaczmar
    Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY, 14853, USA.
  • Chad DeChant
    First author: Department of Computer Science, Columbia University in the City of New York, 10027; second, fourth, and sixth authors: Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY 14853; third author: Department of Mechanical Engineering, Columbia University; fifth author: Uber AI Labs, San Francisco 94103; seventh author: Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University; and eighth author: Department of Mechanical Engineering and Institute of Data Science, Columbia University.
  • Harvey Wu
    Department of Computer Science, Columbia University, New York, NY, 10027, USA.
  • Rebecca J Nelson
    First author: Department of Computer Science, Columbia University in the City of New York, 10027; second, fourth, and sixth authors: Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY 14853; third author: Department of Mechanical Engineering, Columbia University; fifth author: Uber AI Labs, San Francisco 94103; seventh author: Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University; and eighth author: Department of Mechanical Engineering and Institute of Data Science, Columbia University.
  • Hod Lipson
    Columbia University, Department of Mechanical Engineering, New York, NY 10027, USA.
  • Michael A Gore
    First author: Department of Computer Science, Columbia University in the City of New York, 10027; second, fourth, and sixth authors: Plant Breeding and Genetics Section, School of Integrative Plant Science, Cornell University, Ithaca, NY 14853; third author: Department of Mechanical Engineering, Columbia University; fifth author: Uber AI Labs, San Francisco 94103; seventh author: Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University; and eighth author: Department of Mechanical Engineering and Institute of Data Science, Columbia University.

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