Practical method of cell segmentation in electron microscope image stack using deep convolutional neural network☆.

Journal: Microscopy (Oxford, England)
PMID:

Abstract

Segmentation of three-dimensional (3D) electron microscopy (EM) image stacks is an arduous and tedious task. Deep convolutional neural networks (CNNs) work well to automate the segmentation; however, they require a large training dataset, which is a major impediment. In order to solve this issue, especially for sparse segmentation, we used a CNN with a minimal training dataset. We segmented a Cerebellar Purkinje cell from an image stack of a mouse Cerebellum cortex in less than two working days, which is much shorter than that of the conventional method. We concluded that we can reduce the total labor time for the sparse segmentation by reducing the training dataset.

Authors

  • Kohki Konishi
    Nikon Corporation, Research and Development Division, 471, Nagaodai, Sakae, Yokohama, Kanagawa 244-8533, Japan.
  • Masafumi Mimura
    Nikon Corporation, Research and Development Division, 471, Nagaodai, Sakae, Yokohama, Kanagawa 244-8533, Japan.
  • Takao Nonaka
    Nikon Corporation, Optical Engineering Division, 471, Nagaodai, Sakae, Yokohama, Kanagawa 244-8533, Japan.
  • Ichiro Sase
    Nikon Corporation, Healthcare Business Unit, 471, Nagaodai, Sakae, Yokohama, Kanagawa 244-8533, Japan.
  • Hideo Nishioka
    JEOL Co. LTD., Application Group, EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
  • Mitsuo Suga
    JEOL Co. LTD., Strategy Management Planning Office, 3-1-2, Musashino, Akishima, Tokyo 196-8558, Japan.