Machine learning of diffraction image patterns for accurate classification of cells modeled with different nuclear sizes.

Journal: Journal of biophotonics
Published Date:

Abstract

Measurement of nuclear-to-cytoplasm (N:C) ratios plays an important role in detection of atypical and tumor cells. Yet, current clinical methods rely heavily on immunofluroescent staining and manual reading. To achieve the goal of rapid and label-free cell classification, realistic optical cell models (OCMs) have been developed for simulation of diffraction imaging by single cells. A total of 1892 OCMs were obtained with varied nuclear volumes and orientations to calculate cross-polarized diffraction image (p-DI) pairs divided into three nuclear size groups of OCM , OCM and OCM based on three prostate cell structures. Binary classifications were conducted among the three groups with image parameters extracted by the algorithm of gray-level co-occurrence matrix. The averaged accuracy of support vector machine (SVM) classifier on test dataset of p-DI was found to be 98.8% and 97.5% respectively for binary classifications of OCM vs OCM and OCM vs OCM for the prostate cancer cell structure. The values remain about the same at 98.9% and 97.8% for the smaller prostate normal cell structures. The robust performance of SVM over clustering classifiers suggests that the high-order correlations of diffraction patterns are potentially useful for label-free detection of single cells with large N:C ratios.

Authors

  • Jing Liu
    Department of Ophthalmology, Beijing Hospital, National Center of Gerontology, Institute of Geriatric Medicine, Chinese Academy of Medical Sciences, Beijing, China.
  • Yaohui Xu
    Institute for Advanced Optics, Hunan Institute of Science and Technology, Yueyang, Hunan, China.
  • Wenjin Wang
  • Yuhua Wen
    Institute for Advanced Optics, Hunan Institute of Science and Technology, Yueyang, Hunan, China.
  • Heng Hong
    Department of Pathology and Comparative Medicine, Wake Forest School of Medicine, Wake Forest University, Winston-Salem, North Carolina, USA.
  • Jun Q Lu
    Institute for Advanced Optics, Hunan Institute of Science and Technology, Yueyang, Hunan, China.
  • Peng Tian
    Department of Electrical and Computer Engineering, Northeastern University, 360 Huntington Avenue, 409 Dana, Boston, MA 02115, USA. Electronic address: pengtian@ece.neu.edu.
  • Xin-Hua Hu
    Institute for Advanced Optics, Hunan Institute of Science and Technology, Yueyang, Hunan, China.