A hierarchical three-step superpixels and deep learning framework for skin lesion classification.

Journal: Methods (San Diego, Calif.)
Published Date:

Abstract

Skin cancer is one of the most common and dangerous cancer that exists worldwide. Malignant melanoma is one of the most dangerous skin cancer types has a high mortality rate. An estimated 196,060 melanoma cases will be diagnosed in 2020 in the USA. Many computerized techniques are presented in the past to diagnose skin lesions, but they are still failing to achieve significant accuracy. To improve the existing accuracy, we proposed a hierarchical framework based on two-dimensional superpixels and deep learning. First, we enhance the contrast of original dermoscopy images by fusing local and global enhanced images. The entire enhanced images are utilized in the next step to segmentation skin lesions using three-step superpixel lesion segmentation. The segmented lesions are mapped over the whole enhanced dermoscopy images and obtained only segmented color images. Then, a deep learning model (ResNet-50) is applied to these mapped images and learned features through transfer learning. The extracted features are further optimized using an improved grasshopper optimization algorithm, which is later classified through the Naïve Bayes classifier. The proposed hierarchical method has been evaluated on three datasets (Ph2, ISBI2016, and HAM1000), consisting of three, two, and seven skin cancer classes. On these datasets, our method achieved an accuracy of 95.40%, 91.1%, and 85.50%, respectively. The results show that this method can be helpful for the classification of skin cancer with improved accuracy.

Authors

  • Farhat Afza
    Department of Computer Science, COMSATS University Islamabad, Wah Campus, Pakistan.
  • Muhammad Sharif
    Department of Computer Science, COMSATS Institute of Information Technology, Wah Cantonment, Pakistan.
  • Mamta Mittal
    G.B. Pant Govt. Engineering College, Okhla, New Delhi, India.
  • Muhammad Attique Khan
    Department of Computer Science, HITEC University, Taxila, Pakistan.
  • D Jude Hemanth
    Department of ECE, Karunya Institute of Technology and Sciences, Coimbatore, India. Electronic address: judehemanth@karunya.edu.