Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation.

Journal: Small methods
Published Date:

Abstract

Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and statistically relevant analysis of particle characteristics (such as size, shape, and composition) is required that would greatly benefit from automated image analysis procedures. While deep learning shows impressive results in object detection tasks, its applicability is limited by the amount of representative, experimentally collected and manually annotated training data. Here, an elegant, flexible, and versatile method to bypass this costly and tedious data acquisition process is presented. It shows that using a rendering software allows to generate realistic, synthetic training data to train a state-of-the art deep neural network. Using this approach, a segmentation accuracy can be derived that is comparable to man-made annotations for toxicologically relevant metal-oxide nanoparticle ensembles which were chosen as examples. The presented study paves the way toward the use of deep learning for automated, high-throughput particle detection in a variety of imaging techniques such as in microscopies and spectroscopies, for a wide range of applications, including the detection of micro- and nanoplastic particles in water and tissue samples.

Authors

  • Leonid Mill
    Pattern Recognition Lab, Friedrich-Alexander-University Erlangen-Nuremberg, 91058, Erlangen, Germany.
  • David Wolff
    Institut für Nanotechnologie und korrelative Mikroskopie, 91301, Forchheim, Germany.
  • Nele Gerrits
    VITO NV, Unit Health, Mol, Belgium.
  • Patrick Philipp
    Advanced Instrumentation for Ion Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology, Belvaux, L-4422, Luxembourg.
  • Lasse Kling
    Institut für Nanotechnologie und korrelative Mikroskopie, 91301, Forchheim, Germany.
  • Florian Vollnhals
    Institute of Optics, Information and Photonics, Friedrich-Alexander-University Erlangen-Nuremberg, 91058, Erlangen, Germany.
  • Andrew Ignatenko
    Advanced Instrumentation for Ion Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology, Belvaux, L-4422, Luxembourg.
  • Christian Jaremenko
    Pattern Recognition Lab, Computer Science, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen, Germany.
  • Yixing Huang
    Pattern Recognition Lab, Friedrich-Alexander-Universität Erlangen-Nürnberg, Martensstr. 3, 91058, Erlangen, Germany. yixing.yh.huang@fau.de.
  • Olivier De Castro
    Advanced Instrumentation for Ion Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology, Belvaux, L-4422, Luxembourg.
  • Jean-Nicolas Audinot
    Advanced Instrumentation for Ion Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology, Belvaux, L-4422, Luxembourg.
  • Inge Nelissen
    Health Unit, Flemish Institute for Technological Research, Mol, 2400, Belgium.
  • Tom Wirtz
    Advanced Instrumentation for Ion Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology, Belvaux, L-4422, Luxembourg.
  • Andreas Maier
    Pattern Recognition Lab, University Erlangen-Nürnberg, Erlangen, Germany.
  • Silke Christiansen
    Institute of Optics, Information and Photonics, Friedrich-Alexander-University Erlangen-Nuremberg, 91058, Erlangen, Germany.