Ultrasonic Defect Characterization Using the Scattering Matrix: A Performance Comparison Study of Bayesian Inversion and Machine Learning Schemas.
Journal:
IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Published Date:
Oct 1, 2021
Abstract
Accurate defect characterization is desirable in the ultrasonic nondestructive evaluation as it can provide quantitative information about the defect type and geometry. For defect characterization using ultrasonic arrays, high-resolution images can provide the size and type information if a defect is relatively large. However, the performance of image-based characterization becomes poor for small defects that are comparable to the wavelength. An alternative approach is to extract the far-field scattering coefficient matrix from the array data and use it for characterization. Defect characterization can be performed based on a scattering matrix database that consists of the scattering matrices of idealized defects with varying parameters. In this article, the problem of characterizing small surface-breaking notches is studied using two different approaches. The first approach is based on the introduction of a general coherent noise model, and it performs characterization within the Bayesian framework. The second approach relies on a supervised machine learning (ML) schema based on a scattering matrix database, which is used as the training set to fit the ML model exploited for the characterization task. It is shown that convolutional neural networks (CNNs) can achieve the best characterization accuracy among the considered ML approaches, and they give similar characterization uncertainty to that of the Bayesian approach if a notch is favorably oriented. The performance of both approaches varied for unfavorably oriented notches, and the ML approach tends to give results with higher variance and lower biases.