A Transfer Learning-Based Classification Model for Particle Pruning in Cryo-Electron Microscopy.

Abstract

Authors

• Hongjia Li
  High Performance Computer Research Center, Institute of Computing Technology Chinese Academy of Sciences, Beijing 100190, China.
• Ge Chen
  University of Chinese Academy of Sciences, Beijing, China.
• Shan Gao
  Department of Mathematics and Statistics, Yunnan University, China.
• Jintao Li
  High Performance Computer Research Center, Institute of Computing Technology Chinese Academy of Sciences, Beijing 100190, China.
• Xiaohua Wan
  High Performance Computer Research Center, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China. wanxiaohua@ict.ac.cn.
• Fa Zhang
  High Performance Computer Research Center, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China.

Keywords

External Resources