A Hard Voting Policy-Driven Deep Learning Architectural Ensemble Strategy for Industrial Products Defect Recognition and Classification.

Journal: Sensors (Basel, Switzerland)
PMID:

Abstract

Manual or traditional industrial product inspection and defect-recognition models have some limitations, including process complexity, time-consuming, error-prone, and expensiveness. These issues negatively impact the quality control processes. Therefore, an efficient, rapid, and intelligent model is required to improve industrial products' production fault recognition and classification for optimal visual inspections and quality control. However, intelligent models obtained with a tradeoff of high accuracy for high latency are tedious for real-time implementation and inferencing. This work proposes an ensemble deep-leaning architectural framework based on a deep learning model architectural voting policy to compute and learn the hierarchical and high-level features in industrial artefacts. The voting policy is formulated with respect to three crucial viable model characteristics: model optimality, efficiency, and performance accuracy. In the study, three publicly available industrial produce datasets were used for the proposed model's various experiments and validation process, with remarkable results recorded, demonstrating a significant increase in fault recognition and classification performance in industrial products. In the study, three publicly available industrial produce datasets were used for the proposed model's various experiments and validation process, with remarkable results recorded, demonstrating a significant increase in fault recognition and classification performance in industrial products.

Authors

  • Okeke Stephen
    Department of Computer Engineering, Dongseo University, Busan, Republic of Korea.
  • Samaneh Madanian
    Computer Science & Software Engineering, Auckland University of Technology, Auckland 1010, New Zealand.
  • Minh Nguyen
    Clinical Imaging Research Centre, Centre for Sleep and Cognition, N.1 Institute for Health and Memory Networks Program, National University of Singapore, Singapore; Department of Electrical and Computer Engineering, National University of Singapore, Singapore.