Taming Prolonged Ionic Drift-Diffusion Dynamics for Brain-Inspired Computation.

Journal: Advanced materials (Deerfield Beach, Fla.)
PMID:

Abstract

Recent advances in neural network-based computing have enabled human-like information processing in areas such as image classification and voice recognition. However, many neural networks run on conventional computers that operate at GHz clock frequency and consume considerable power compared to biological neural networks, such as human brains, which work with a much slower spiking rate. Although many electronic devices aiming to emulate the energy efficiency of biological neural networks have been explored, achieving long timescales while maintaining scalability remains an important challenge. In this study, a field-effect transistor based on the oxide semiconductor strontium titanate (SrTiO) achieves leaky integration on a long timescale by leveraging the drift-diffusion of oxygen vacancies in this material. Experimental analysis and finite-element model simulations reveal the mechanism behind the leaky integration of the SrTiO transistor. With a timescale in the order of one second, which is close to that of biological neuron activity, this transistor is a promising component for biomimicking neuromorphic computing.

Authors

  • Hisashi Inoue
    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8565, Japan.
  • Hiroto Tamura
    Graduate School of Engineering, The University of Tokyo, 113-8656 Tokyo, Japan; International Research Center for Neurointelligence, The University of Tokyo, 113-0033 Tokyo, Japan. Electronic address: h-tamura@g.ecc.u-tokyo.ac.jp.
  • Ai Kitoh
    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8565, Japan.
  • Xiangyu Chen
  • Zolboo Byambadorj
    Systems Design Laboratory, School of Engineering, The University of Tokyo, Tokyo, 113-0032, Japan.
  • Takeaki Yajima
    Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka, 819-0395, Japan.
  • Yasushi Hotta
    Department of Engineering, University of Hyogo, Hyogo, 671-2280, Japan.
  • Tetsuya Iizuka
    Systems Design Laboratory, School of Engineering, The University of Tokyo, Tokyo, 113-0032, Japan.
  • Gouhei Tanaka
    Institute for Innovation in International Engineering Education, Graduate School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan; Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan. Electronic address: gouhei@sat.t.u-tokyo.ac.jp.
  • Isao H Inoue
    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8565, Japan.