Working-memory load decoding model inspired by brain cognition based on cross-frequency coupling.

Journal: Brain research bulletin
PMID:

Abstract

Working memory, a fundamental cognitive function of the brain, necessitates the evaluation of cognitive load intensity due to limited cognitive resources. Optimizing cognitive load can enhance task performance efficiency by preventing resource waste and overload. Therefore, identifying working memory load is an essential area of research. Deep learning models have demonstrated remarkable potential in identifying the intensity of working memory load. However, existing neural networks based on electroencephalogram (EEG) decoding primarily focus on temporal and spatial characteristics while neglecting frequency characteristics. Drawing inspiration from the role of cross-frequency coupling in the hippocampal region, which plays a crucial role in advanced cognitive processes such as working memory, this study proposes a Multi-Band Multi-Scale Hybrid Sinc Convolutional Neural Network (MBSincNex). This model integrates multi-frequency and multi-scale Sinc convolution to facilitate time-frequency conversion and extract time-frequency information from multiple rhythms and regions of the EEG data with the aim of effectively model the cross-frequency coupling across different cognitive domains. Due to its unique structural design, the proposed model proficiently extracts features in temporal, frequency, and spatial domains while its feature extraction capability is validated through post-hoc interpretability techniques. On our collected three-class working memory dataset, the proposed model achieved higher classification accuracy compared to other state-of-the-art methods. Furthermore, by analyzing the model's classification performance during different stages of working memory processes, this study emphasizes the significance of the encoding phase and confirms that behavioral response does not accurately reflect cognitive load.

Authors

  • Jing Zhang
    MOEMIL Laboratory, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, China.
  • Tingyi Tan
    School of Life and Health Information Science and Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China.
  • Yuhao Jiang
    Ira A Fulton Schools of Engineering, Arizona State University, Tempe, AZ, 85281, United States of America.
  • Congming Tan
    College of Computer Science and Technology, ChongQing University of Posts and Telecommunications, ChongQing 400065, China.
  • Liangliang Hu
    College of Computer Science and Technology, ChongQing University of Posts and Telecommunications, ChongQing 400065, China.
  • Daowen Xiong
    School of Life and Health Information Science and Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China.
  • Yikang Ding
    School of Life and Health Information Science and Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China.
  • Guowei Huang
  • Junjie Qin
    Department of Chemistry, National University of Singapore, Singapore, 117543, Singapore.
  • Yin Tian