Automated seizure detection in epilepsy using a novel dynamic temporal-spatial graph attention network.

Journal: Scientific reports
Published Date:

Abstract

Epilepsy is a neurological disorder characterized by recurrent seizures caused by excessive electrical discharges in brain cells, posing significant diagnostic and therapeutic challenges. Dynamic brain network analysis via electroencephalography (EEG) has emerged as a powerful tool for capturing transient functional connectivity changes, offering advantages over static networks. In this study, we propose a Dynamic Temporal-Spatial Graph Attention Network (DTS-GAN) to address the limitations of fixed-topology graph models in analysing time-varying brain networks. By integrating graph signal processing with a hybrid deep learning framework, DTS-GAN collaboratively extracts spatiotemporal features through two key modules: an LSTM-based temporal encoder to model long-term dependencies in EEG sequences, and a dynamic graph attention network with probabilistic Gaussian connectivity, enabling adaptive learning of transient functional interactions across electrode nodes. Experiments on the TUSZ dataset demonstrate that DTS-GAN achieves 89-91% accuracy and a weighted F1-score of 87-91% in classifying seven seizure types, significantly outperforming baseline models. The multi-head attention mechanism and dynamic graph generation strategy effectively resolve the temporal variability of functional connectivity. These results highlight the potential of DTS-GAN in providing precise and automated seizure detection, serving as a robust tool for clinical EEG analysis.

Authors

  • Kunxian Yan
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
  • Xiangyu Luo
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan, 030051, China.
  • Lei Ye
    ZJU-Bioer Technology Research & Development Center, Hangzhou Bioer Technology, Hangzhou, 310053, China.
  • Wenping Geng
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
  • Jian He
    School of Software Engineering, Beijing University of Technology, Beijing, China. Electronic address: jianhee@bjut.edu.cn.
  • Jiliang Mu
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
  • Xiaojuan Hou
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
  • Xiang Zan
    Shanxi Provincial People's Hospital, the Fifth Clinical Medical College of Shanxi Medical University, Taiyuan 030012, China.
  • Jiuhong Ma
    Shanxi Provincial People's Hospital, the Fifth Clinical Medical College of Shanxi Medical University, Taiyuan 030012, China.
  • Fei Li
    Institute for Precision Medicine, Tsinghua University, Beijing, China.
  • Le Zhang
    State Key Laboratory of Multiphase Complex Systems, Institute of Process Engineering, Chinese Academy of Sciences, Beijing 100190, China; College of Chemical Engineering, University of Chinese Academy of Sciences, Beijing 100049, China; Key Laboratory of Science and Technology on Particle Materials, Institute of Process Engineering, Chinese Academy of Sciences, Beijing 361021, China.
  • Xiujian Chou
    Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.