Nonlinear Semi-Supervised Metric Learning Via Multiple Kernels and Local Topology.

Journal: International journal of neural systems
Published Date:

Abstract

Changing the metric on the data may change the data distribution, hence a good distance metric can promote the performance of learning algorithm. In this paper, we address the semi-supervised distance metric learning (ML) problem to obtain the best nonlinear metric for the data. First, we describe the nonlinear metric by the multiple kernel representation. By this approach, we project the data into a high dimensional space, where the data can be well represented by linear ML. Then, we reformulate the linear ML by a minimization problem on the positive definite matrix group. Finally, we develop a two-step algorithm for solving this model and design an intrinsic steepest descent algorithm to learn the positive definite metric matrix. Experimental results validate that our proposed method is effective and outperforms several state-of-the-art ML methods.

Authors

  • Xin Li
    Veterinary Diagnostic Center, Shanghai Animal Disease Control Center, Shanghai, China.
  • Yanqin Bai
    3 Department of Mathematics, School of Science, Shanghai University, Shanghai 200444, P. R. China.
  • Yaxin Peng
    3 Department of Mathematics, School of Science, Shanghai University, Shanghai 200444, P. R. China.
  • Shaoyi Du
    Institute of Artificial Intelligence and Robotics, Xian Jiaotong University, Xian Shanxi Province, China.
  • Shihui Ying
    Department of Mathematics, School of Science, Shanghai University, China. Electronic address: shying@shu.edu.cn.