Denoising and Motion Artifact Removal Using Deformable Kernel Prediction Neural Network for Color-Intensified CMOS.

Journal: Sensors (Basel, Switzerland)
Published Date:

Abstract

Image intensifiers are used internationally as advanced military night-vision devices. They have better imaging performance in low-light-level conditions than CMOS/CCD. The intensified CMOS (ICMOS) was developed to satisfy the digital demand of image intensifiers. In order to make the ICMOS capable of color imaging in low-light-level conditions, a liquid-crystal tunable filter based color imaging ICMOS was developed. Due to the time-division color imaging scheme, motion artifacts may be introduced when a moving target is in the scene. To solve this problem, a deformable kernel prediction neural network (DKPNN) is proposed for joint denoising and motion artifact removal, and a data generation method which generates images with color-channel motion artifacts is also proposed to train the DKPNN. The results show that, compared with other denoising methods, the proposed DKPNN performed better both on generated noisy data and on real noisy data. Therefore, the proposed DKPNN is more suitable for color ICMOS denoising and motion artifact removal. A new exploration was made for low-light-level color imaging schemes.

Authors

  • Zhenghao Han
    Key Laboratory of Photo-Electronic Imaging Technology and Systems, School of Optics and Photonics, Ministry of Education of China, Beijing Institute of Technology, Beijing 100081, China.
  • Li Li
    Department of Gastric Surgery, Sichuan Clinical Research Center for Cancer, Sichuan Cancer Hospital & Institute, Sichuan Cancer Center, Affiliated Cancer Hospital of University of Electronic Science and Technology of China, Chengdu, China.
  • Weiqi Jin
    Key Laboratory of Photo-Electronic Imaging Technology and Systems, School of Optics and Photonics, Ministry of Education of China, Beijing Institute of Technology, Beijing 100081, China.
  • Xia Wang
    Department of Neurology, The Sixth People's Hospital of Huizhou City, Huizhou, China.
  • Gangcheng Jiao
    Science and Technology on Low-Light-Level Night Vision Laboratory, Xi'an 710065, China.
  • Xuan Liu
    Department of Electrical and Computer Engineering, New Jersey Institute of Technology, University Heights, Newark, NJ 07102, USA.
  • Hailin Wang
    Key Laboratory of Photo-Electronic Imaging Technology and Systems, School of Optics and Photonics, Ministry of Education of China, Beijing Institute of Technology, Beijing 100081, China.