Explainable Artificial Intelligence for Bias Detection in COVID CT-Scan Classifiers.

Journal: Sensors (Basel, Switzerland)
Published Date: Aug 23, 2021

Abstract

PROBLEM: An application of Explainable Artificial Intelligence Methods for COVID CT-Scan classifiers is presented.

Authors

  • Iam Palatnik de Sousa
    Department of Electrical Engineering, Pontifical Catholic University of Rio de Janeiro, Rio de Janeiro 22451-900, Brazil. iam.palat@gmail.com.
  • Marley M B R Vellasco
    Electrical Engineering Department, Pontifical Catholic University of Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225, 22.451-900, Rio de Janeiro, RJ, Brazil.
  • Eduardo Costa da Silva
    Department of Electrical Engineering, Pontifical Catholic University of Rio de Janeiro, Rio de Janeiro 22451-900, Brazil.

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