Deep learning-based extended field of view computed tomography image reconstruction: influence of network design on image estimation outside the scan field of view.

Journal: Biomedical physics & engineering express
Published Date:

Abstract

The problem of data truncation in Computed Tomography (CT) is caused by the missing data when the patient exceeds the Scan Field of View (SFOV) of a CT scanner. The reconstruction of a truncated scan produces severe truncation artifacts both inside and outside the SFOV. We have employed a deep learning-based approach to extend the field of view and suppress truncation artifacts. Thereby, our aim is to generate a good estimate of the real patient data and not to provide a perfect and diagnostic image even in regions beyond the SFOV of the CT scanner. This estimate could then be used as an input to higher order reconstruction algorithms [1]. To evaluate the influence of the network structure and layout on the results, three convolutional neural networks (CNNs), in particular a general CNN called ConvNet, an autoencoder, and the U-Net architecture have been investigated in this paper. Additionally, the impact of L1, L2, structural dissimilarity and perceptual loss functions on the neural network's learning have been assessed and evaluated. The evaluation of data set comprising 12 truncated test patients demonstrated that the U-Net in combination with the structural dissimilarity loss showed the best performance in terms of image restoration in regions beyond the SFOV of the CT scanner. Moreover, this network produced the best mean absolute error, L1, L2, and structural dissimilarity evaluation measures on the test set compared to other applied networks. Therefore, it is possible to achieve truncation artifact removal using deep learning techniques.

Authors

  • Bhupinder Singh Khural
    Pattern Recognition Lab at FAU Erlangen-Nürnberg, Martensstr. 3, 91058 Erlangen, Germany.
  • Matthias Baer-Beck
    Siemens Healthcare GmbH, Computed Tomography, Siemensstr. 3, 91301 Forchheim, Germany.
  • Eric Fournié
    Siemens Healthineers, Forchheim, Germany.
  • Karl Stierstorfer
    Siemens Healthineers, Forchheim, Germany.
  • Yixing Huang
    Pattern Recognition Lab, Friedrich-Alexander-Universität Erlangen-Nürnberg, Martensstr. 3, 91058, Erlangen, Germany. yixing.yh.huang@fau.de.
  • Andreas Maier
    Pattern Recognition Lab, University Erlangen-Nürnberg, Erlangen, Germany.