Epileptic Seizure Prediction Using Spatiotemporal Feature Fusion on EEG.

Journal: International journal of neural systems
Published Date:

Abstract

Electroencephalography (EEG) plays a crucial role in epilepsy analysis, and epileptic seizure prediction has significant value for clinical treatment of epilepsy. Currently, prediction methods using Convolutional Neural Network (CNN) primarily focus on local features of EEG, making it challenging to simultaneously capture the spatial and temporal features from multi-channel EEGs to identify the preictal state effectively. In order to extract inherent spatial relationships among multi-channel EEGs while obtaining their temporal correlations, this study proposed an end-to-end model for the prediction of epileptic seizures by incorporating Graph Attention Network (GAT) and Temporal Convolutional Network (TCN). Low-pass filtered EEG signals were fed into the GAT module for EEG spatial feature extraction, and followed by TCN to capture temporal features, allowing the end-to-end model to acquire the spatiotemporal correlations of multi-channel EEGs. The system was evaluated on the publicly available CHB-MIT database, yielding segment-based accuracy of 98.71%, specificity of 98.35%, sensitivity of 99.07%, and 1-score of 98.71%, respectively. Event-based sensitivity of 97.03% and False Positive Rate (FPR) of 0.03/h was also achieved. Experimental results demonstrated this system can achieve superior performance for seizure prediction by leveraging the fusion of EEG spatiotemporal features without the need of feature engineering.

Authors

  • Dezan Ji
    School of Integrated Circuits, Shandong University, Jinan 250100, P. R. China.
  • Landi He
    School of Integrated Circuits, Shandong University, Jinan 250100, P. R. China.
  • Xingchen Dong
    School of Integrated Circuits, Shandong University, Jinan 250100, P. R. China.
  • Haotian Li
    Key Laboratory for Biomedical Engineering of Ministry of Education, Department of Biomedical Engineering, College of Biomedical Engineering & Instrument Science, Zhejiang University, Hangzhou, 310027, China.
  • Xiangwen Zhong
    School of Integrated Circuits, Shandong University, Jinan 250100, P. R. China.
  • Guoyang Liu
    School of Microelectronics, Shandong University, Jinan 250100, P. R. China.
  • Weidong Zhou