Multiplexed TEM Specimen Preparation and Analysis of Plasmonic Nanoparticles.

Journal: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Published Date:

Abstract

We describe a system for rapidly screening hundreds of nanoparticle samples using transmission electron microscopy (TEM). The system uses a liquid handling robot to place up to 96 individual samples onto a single standard TEM grid at separate locations. The grid is then transferred into the TEM and automated software is used to acquire multiscale images of each sample. The images are then analyzed to extract metrics on the size, shape, and morphology of the nanoparticles. The system has been used to characterize plasmonically active nanomaterials.

Authors

  • Sean K Mulligan
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Jeffrey A Speir
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Ivan Razinkov
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Anchi Cheng
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • John Crum
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Tilak Jain
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Erika Duggan
    Scintillon Institute, San Diego, California, 92121, USA.
  • Er Liu
    La Jolla Bioengineering Institute, San Diego, California, 92121, USA.
  • John P Nolan
    Scintillon Institute, San Diego, California, 92121, USA.
  • Bridget Carragher
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.
  • Clinton S Potter
    The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.